14th IEEE Instrumentation and Measurement Technology Conference - IMTC 1997, Ottawa (Canadá). 19-21 mayo 1997
Resumen:
A considerable number of measurements for material, device and system characterization rely on the analysis of its step response. Sometimes, there is no accepted model for the physical phenomenon, so that not only the values, but also the numbers of time constants are to be determined. A similar case can occur when we must try to choose between different models. This work presents an algorithm to determine the number of the exponential terms in the waveform that can be safely measured given the measurement system accuracy.
Palabras clave: Time measurement,Noise measurement, Fitting, Telecommunications, Composite materials, Materials testing, System testing, Transient response, Writing, Random sequences
DOI: 
https://doi.org/10.1109/IMTC.1997.604008
Publicado en: , pp: 544-547
Fecha de publicación: 19-may-1997
Cita:
R. Giannetti, "Multiple time constants measurement: an accuracy-based approach", presentado en 14th IEEE Instrumentation and Measurement Technology Conference - IMTC 1997, Ottawa, Canadá, 19-21 mayo 1997, pp. 544-547, doi: 10.1109/IMTC.1997.604008
IIT-97-078A
